38514000 – Darkfield and scanning probe microscopes

Darkfield and scanning probe microscopes code description

Category Name: Darkfield and Scanning Probe Microscopes

Description: The Darkfield and Scanning Probe Microscopes category encompasses advanced scientific instruments used for various research and analysis purposes. Darkfield microscopes, represented by the CPV code 38514100, are specialized optical devices that enable the observation of transparent or translucent samples by illuminating them from the side. These microscopes are particularly useful for studying live biological specimens or materials with low contrast. On the other hand, scanning probe microscopes, identified by the CPV code 38514200, utilize a sharp probe to scan the surface of a sample, providing high-resolution imaging and precise measurements at the nanoscale level. These microscopes are commonly employed in nanotechnology, materials science, and semiconductor research. Whether you require enhanced visualization of transparent samples or detailed analysis of nanoscale structures, the Darkfield and Scanning Probe Microscopes category offers cutting-edge solutions for your scientific needs.